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Former Philips Engineer Convicted of Stealing X-Ray Trade Secrets to Help Chinese Competitor

Posted on August 26, 2026

Mallet of judge in American courtroom. American flag in courtroom with Judge hammer or Mallet of judge. Justice concept in courtroom.CHICAGO — A former Philips Medical Systems engineer was convicted of stealing closely guarded X-ray technology and using it to help a Chinese competitor enter the medical-imaging market.

A federal jury found Chih-Yee Jen, 71, of Mequon, Wisconsin, guilty after a weeklong trial in U.S. District Court in Chicago. Jen was convicted of conspiracy to steal, misappropriate or possess trade secrets and possession or attempted possession of stolen trade secrets.

Jen worked as an engineer at Philips’ facility in Aurora, Illinois, where employees researched, developed and manufactured X-ray tubes used in computed tomography, or CT, medical-imaging machines.

Through its Dunlee brand, Philips spent years developing proprietary X-ray technology and selling medical-imaging equipment to health care facilities.

The scheme began taking shape in 2017 as Philips prepared to close the Aurora plant.

Statue of Justice with American flag in background.According to federal prosecutors, China-based Kunshan GuoLi Electronic Technology Co. Ltd. and one of its vice presidents, Xiaoqin Du, began communicating with Jen about establishing a U.S. subsidiary that could compete with Philips in developing, manufacturing and selling X-ray tubes.

While still working for Philips, Jen shared confidential company documents with Kunshan GuoLi and Du, prosecutors said. He also recruited several Philips engineers to work for the Chinese company’s new subsidiary.

Jen copied proprietary X-ray technology from Philips’ internal databases and later used the stolen information while developing competing technology for the Kunshan GuoLi subsidiary, according to evidence presented at trial.

U.S. District Judge Edmond E. Chang scheduled Jen’s sentencing for Jan. 5, 2027.

Two other former Philips engineers — Fince Tendian, 57, of Aurora, and Vladimir Nevtonenko, 77, of Arlington Heights, Illinois — pleaded guilty before Jen’s trial and admitted possessing stolen trade secrets.

Nevtonenko is scheduled to be sentenced Dec. 1, 2026. Tendian’s sentencing is set for Dec. 8, 2026.

Du, 64, of Suzhou, China; Kunshan GuoLi; and a related company, Kunshan Yiyuan Medical Technology Co. Ltd., were also indicted. They have not been arraigned and were placed on the court’s fugitive calendar. The charges against them remain allegations, and they are presumed innocent unless proven guilty.

Quick Facts

  • Defendant: Chih-Yee Jen, 71
  • Residence: Mequon, Wisconsin
  • Former employer: Philips Medical Systems
  • Worksite: Aurora, Illinois
  • Technology involved: X-ray tubes used in CT scanners
  • Verdict: Guilty on two counts
  • Trial: One week in federal court in Chicago
  • Sentencing: Jan. 5, 2027
  • Judge: U.S. District Judge Edmond E. Chang
  • Other guilty pleas: Fince Tendian and Vladimir Nevtonenko
  • Unarraigned defendants: Xiaoqin Du and two Chinese companies

Meta Description

A federal jury convicted former Philips engineer Chih-Yee Jen of stealing proprietary X-ray technology for use by a Chinese competitor.

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News-Related Links

  • Original federal indictment and case background
  • Northern District of Illinois news releases
  • FBI intellectual property theft information

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